IMS2015 Panel Session Chairs:
Sayfe Kiaei, Arizona State University
Rashaunda Henderson, The University of Texas at Dallas
The panel sessions at the International Microwave Symposium (IMS) provide a platform for spirited discussions on topics of interest to the Microwave Theory and Techniques (MTT-S) community. The panels will be held during lunch hours and will include a short presentations by the panelists followed by questions and answers and discussions by the panelist.
On Tuesday, Stephen Goodnick will moderate a session on wearable electronics and its future in the microwave and RF industry. We will have a joint panel between RFIC and IMS on Tuesday during lunch hour. In the afternoon, Kate Remley from the National Institute of Standards and Technology will moderate a panel organized by Women in Microwaves to compare and contrast the issues of diversity in microwave engineering from a global perspective. On Wednesday, there will be two panels: Sayfe Kiaei will chair a panel on the Next Grand challenges in Microwave, RFIC, Sensors, and Communications. The second panel will discuss the architectures, applications, standards and regulatory issues on the next generation of 5G systems. On Thursday, Cedric Mayor from Presto Engineering has organized an expert panel to discuss the roadblocks associated with the adoption of industrial tests for millimeter wave RFICs. We look forward to your active participation and hope that you will find the panels interesting and enjoyable.
Tuesday May 19, 12:00 - 13:30
Wearable Electronics- Is it a Fad or the Future of Electronics?
Stephen Goodnick, Arizona State University
Vijay Nair, Intel Corporation
Wearable electronics have received considerable publicity for their potential applications in healthcare, fitness, defense, education, ubiquitous computing, gaming and entertainment. Some recent products include for example Google Glass and smart watches, while future technologies are envisioned such as implantable systems for health monitoring, therapeutics, smart skin and other biocompatible applications based on fully flexible electronic circuitry. Such systems must have elements of communications, data input/output, data processing and energy management. The panel will debate whether such trends represent a viable technology evolution for electronics, or whether this will remain a niche market, what is the future evolution of the field and what are the barriers to success.
- Sanjay Gupta, Vice President of Technology, MC10 Inc.
- Lakshman Krishnamurthy, Intel Fellow and Director of New Devices Group
- Steffen Kröhnert, Director of Technology, NANIUM S.A.
- Victor M. Lubecke, Professor, University of Hawaii
- Manos Tentzeris, Professor, Georgia Institute of Technology
- John Volakis, Chope Chair Professor, Ohio State University
Tuesday May 19, 15:30 - 17:00
Diversity in Microwaves: Let’s Talk About the Demographics
Dr. Kate A. Remley, National Institute of Standards and Technology
IEEE MTT-S Women in Microwaves
Having an inclusive work or academic environment that allows for diverse membership leads to new ideas and thoughts for solving problems. IEEE Women in Engineering (WIE) seeks to recruit and retain women in technical disciplines related to the mission of IEEE, which is to foster technological innovation and excellence for the benefit of humanity. Women in Microwaves (WIM) desires to bring a diversity of thought into the MTT-S community by discussing global concerns. This panel will bring together industrial and academic colleagues representing the 10 regions of IEEE. This includes North America (Regions 1-7), Europe, Africa and the Middle East (Region 8), Latin America (Region 9) and Asia and the Pacific (Region 10). We will have a lively discussion about diversity in microwave engineering. While the US is focusing on increasing the workforce pipeline, another region of the globe is focusing on perceptions of women in the workplace. Some areas of the world are seeking to increase diversity numbers while others are working towards dispelling cultural stereotypes. We plan to debate and discuss how visible diversity in ethnicity, gender, age, and physical attributes can be used to improve the microwave and wireless workforce.
- Charlotte Blair, Senior Application Engineer, ANSYS, US
- Helen Duncan, Managing Director, MWE Media Ltd., UK
- Rhonda Franklin, Professor, University of Minnesota, US
- Carmen Maya, Researcher and Professor, Center for Scientific Research and Higher Education at Ensenada, Baja CA (CICESE), MX
- Qiaowei Yuan, Professor, Sendai National College of Technology, JP
Wednesday May 20, 12:00 - 13:30
Next Grand challenges in Microwave, RFIC, Sensors, and Communications
Sayfe Kiaei, Professor and Director of Connection One NSF Center
Arizona State University
Hossein Hashemi, Professor
University of Southern California
This panel will discuss the next set of grand challenges in wireless systems, RF and microwave systems, sensors, and communications. The panel will bring together leaders from academia and defense advance project agencies to discuss the next grand challenges in these areas.
- Dr. William Chappell - Microsystem Technology Office DARPA
- Dr. Ali Hajimiri – CalTech
- Dr. Ali Niknejad – UC Berkeley
- Dr Roy Olsson – DARPA, Microsystem Technology Office
- Dr. Dev Palmer - DARPA, Microsystem Technology Office
- Dr. Bruce Wallace – DARPA, Strategic Technology Office
Wednesday May 20, 12:00 - 13:30
Recent News in Millimeterwave Regulations & Standards for Fixed & Mobile Use
Upkar Dhaliwal, CEO & Founder
Future Wireless Technologies LLC, San Diego, CA
Michael Marcus, Adjunct Professor
Virginia Tech (FCC, Retired)
With the issuance by FCC of a Notice of Inquiry on mobile use above 24 GHz on October 17, 2104, and a parallel inquiry from the UK’s Ofcom issued on January 16, 2015, interest in both fixed and mobile commercial millimeterwave (“mmW”) use is rapidly accelerating towards ITU’s WRC2105 and subsequent commercial use. This session will explore where applications, markets, policies and standards in both the US and the world are evolving. For example, 3GPP and ITU-R are studying 5G cellular that is likely to include mmW as a key technology, along with also using lower bands. Indeed, the feasibility of mmW for mobile radio access use is a not a new topic and is presently as controversial as CDMA was for mobile 3 decades ago and FM was for VHF broadcasting 80 years ago. Future 5G services will use various RF spectrum bands up to THz bands, in order to deliver the need for superior connectivity, not just in terms of capacity, data rates, and latency, but also in terms of the mode of connectivity (like device to device, mesh, adhoc, shared spectrum etc.), and the support of new device types, including industrial control devices, wearables, drones, robots,.. etc. The session will have a panel of participants in interactive discussions on architectures, applications, standards and regulatory issues and much time for give and take with the audience.
- Dr. Ali Sadri - Senior Director, mmWave Standards and Advanced Technology, Intel Corp
- John Kurzin, Senior Director, Regulatory, QUALCOMM Inc
- Jerry Pi, CTO, Straight Path Communications Inc
- Michael Marcus, Adjunct Professor, Virginia Tech
Thursday May 21, Lunch
Millimeter Wave RFIC Industrial Test: A Roadblock for Mass Adoption?
Cedric Mayor, CTO, Presto Engineering
Automated test is essential to evaluate the performance of integrated circuits and electronic subsystems. Sophisticated automated test equipment (ATE) has been developed to determine yield in process lines and for packaged parts for many applications. As the frequency of operation increases for commercial systems, the need for ATE and test plans to cover different markets has increased. This panel will achieve the following objectives:
- Present state of the art industrial millimeter wave RF test practices from hardware to automated test equipment (ATE) and test coverage with regard to Telecom vs. Automotive markets.
- Debate how to meet the low cost test objective driven by the opposite trend in optical/wireless networking & automotive systems.
- Debate on how design for testability (DFT) or indirect testing and data mining are valid options to mitigate quality risks.
- Identify technical roadblocks still present to enable a high volume manufacturing compatibility from ATE specifics to test consumables.
- Discuss with the audience how this new space jeopardizes the industrial test paradigm and economics
- Jeffrey Finder, Radar Product and Test Engineering Manager, Freescale Semiconductor
- Mark Roos, CEO, Roos Instruments
- Cedric Mayor, CTO, Presto Engineering
- Claudius Dannenfled, PhD, BL Car Test Engineering Manager, NXP Semiconductor
- Mustafa Slamani, PhD, Sn. Scientist MS-RF Test Development, IBM
- Shinji Yamaura, MMW Project GM, Semiconductor Circuit R&D Div. DENSO Corporation